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Quantitative analyses of power loss mechanisms in semiconductor devices by thermal wave calorimetry

✍ Scribed by Bettine Büchner; Martin Wolf; David Cahen

Book ID: 103951045
Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 357 KB
Volume: 122
Category: Article
ISSN: 0921-5093
DOI: 10.1016/0921-5093(89)90784-3

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