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Quantitative AES Analysis of Fracture Surfaces in the Presence of O- and C-containing Residual Gas

✍ Scribed by Otterbein, U.; Hofmann, S.

Publisher: John Wiley and Sons
Year: 1996
Tongue: English
Weight: 739 KB
Volume: 24
Category: Article
ISSN: 0142-2421
DOI: 10.1002/(sici)1096-9918(199604)24:4<263::aid-sia114>3.0.co;2-k

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✦ Synopsis

The chemical composition of thin segregation layers is calculated using elemental .4uger spectra and considering the adsorption of residual gas components during analysis. We take into account that the coverage with oxygen is different for the different elements in the thin layer and that the shape of the Auger peaks is changed by the coverage. Application of the method is demonstrated for quantitative analysis of in situ fractured grain boundaries of B-doped Ni,AI bicrystals.

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