Quantifying Crystallinity in High Molar Mass Poly(3-hexylthiophene)
β Scribed by Snyder, Chad R.; Nieuwendaal, Ryan C.; DeLongchamp, Dean M.; Luscombe, Christine K.; Sista, Prakash; Boyd, Shane D.
- Book ID
- 123620015
- Publisher
- American Chemical Society
- Year
- 2014
- Tongue
- English
- Weight
- 460 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0024-9297
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π SIMILAR VOLUMES
## Abstract Xβray diffraction studies were performed in order to understand the crystallinity, the molecular orientation and the nanoscale morphology of a lowβ(LMW) and a high molecular weight (HMW) fractions of Poly(3βhexylthiophene) (P3HT) thin films. The thickness of films was found to be in the
## Abstract The nanocrystalline structure of thermally annealed P3HT ultrathin films was studied as a function of the substrate properties using AFM, GIXRD, and static contact angle measurements which showed that an edgeβon structure is formed on both types of substrate. Substrateβinduced ordering