๐”– Bobbio Scriptorium
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Quantification of molecular secondary ion mass spectrometry by internal standards

โœ Scribed by K. Meyer; B. Hagenhoff; M. Deimel; A. Benninghoven; H.-J. Bauch

Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
184 KB
Volume
27
Category
Article
ISSN
1076-5174

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โœฆ Synopsis

OMS Letters

Dear Sir

Quantification of Molecular Secondary ion Mass Spectrometry by Internal Standards

Static secondary ion mass spectrometry (SSIMS)' allows the detection and identification of non-volatile and thermally

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