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Quantification of mechanical deformations induced by an electric field in a semicrystalline organic insulator

✍ Scribed by P. R. Mamy; J. Martinez-Vega; J. C. Dupre; N. Bretagne


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
347 KB
Volume
93
Category
Article
ISSN
0021-8995

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## Abstract An optical nondestructive strain measurement technique was performed to analyze the mechanical deformation induced by an electrical field within the insulating materials. Poly(ethylene naphthalene 2,6‐dicarboxylate) (PEN) films were then subjected to constant electrical fields right up