Quantification of defects in epitaxial metal film growth: a helium diffraction investigation of the Cu/W(110) system

✍ Scribed by Han Xu; Yaw-wen Yang; Thomas Engel

• Publisher: Elsevier Science
• Year: 1991
• Weight: 89 KB
• Volume: 255
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(91)90168-q