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Quantification of bacterial adhesion forces using atomic force microscopy (AFM)

โœ Scribed by Herbert H.P Fang; Kwong-Yu Chan; Li-Chong Xu

Book ID
117360778
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
982 KB
Volume
40
Category
Article
ISSN
0167-7012

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By using atomic force microscopy (AFM)/lateral force microscopy (LFM), a comparative study of the topography as well as the tribological properties (at a micrometer scale) of sized E-glass fibers was done. Normal and lateral deflection signals are recorded when an AFM tip scans a fiber surface. Fric