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Quality of an x-ray beam

โœ Scribed by Albert G. Richards

Book ID
118959516
Publisher
Elsevier Science
Year
1964
Tongue
English
Weight
319 KB
Volume
17
Category
Article
ISSN
0030-4220

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The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering