Quality Assurance Tests of ${\rm Nb}_{3}{\rm Sn}$ Wires for the Series-Connected Hybrid Magnets

✍ Scribed by Lu, Jun; Han, Ke; Dixon, Iain R.; Bunne, Michael; Griffin, Van S.; Zhang, Youzhu; Field, Michael B.; Parrell, Jeff A.

• Book ID: 120618357
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 195 KB
• Volume: 21
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2010.2098382