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Quality assessment of chalcopyrite thin films using Raman spectroscopy

✍ Scribed by Eveline Rudigier; Jacobo Alvarez-Garcia; Ilka Luck; Jo Klaer; Roland Scheer

Book ID: 108356925
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 279 KB
Volume: 64
Category: Article
ISSN: 0022-3697
DOI: 10.1016/s0022-3697(03)00154-9

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