✦ LIBER ✦
Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayers
✍ Scribed by Whangbo, M.H.; Bar, G.; Brandsch, R.
- Book ID
- 113035445
- Publisher
- Springer
- Year
- 1998
- Tongue
- English
- Weight
- 234 KB
- Volume
- 66
- Category
- Article
- ISSN
- 1432-0630
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