A novel family of amorphous molecular ma
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Tetsuya Noda; Hiromitsu Ogawa; Naoki Noma; Prof. Yasuhiko Shirota
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Article
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1997
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John Wiley and Sons
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English
โ 334 KB
๐ 2 views
## AATERIALS (thickness: ca. 1200 A) by simultaneous evaporation from two separate sources. Current-\.oltage-luminance characteristics of the EL devices were measured with an electrometer (Advantest TR6143) and a luminance meter (Minolta LS-100). The electroluminescence and photoluminescence spect