𝔖 Bobbio Scriptorium
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Purity measurement in tetramethylsilane

✍ Scribed by F. Moreau; S. Tisserant; J. Guillon; C. de la Taille; P. Salin

Book ID
103608604
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
310 KB
Volume
306
Category
Article
ISSN
0168-9002

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The electron Hall mobility in tetramethylsihrne (T&IS) has been nnxuured at room temperature using the Rcdtirld rrchniquc. The resulting mobility. 124 crn'/V s is 35% hi;;hcr than the time-of-flight mobility. From their comparison WC' conclttde that it is likely that the electron-scatterins nuxhania