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Pure and mixed titanium, niobium and vanadium as sputtered thick and thin films: Crystallographic properties and phase transitions between 300 and 1800 K II: Electron microscopy investigations of thin films

✍ Scribed by M. Gasgnier; F. Lagnel; B. Poumellec; J.F. Marucco

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 798 KB
Volume: 187
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(90)90108-p

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