Pulsed plasma-enhanced chemical vapor de
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Scott J. Limb; David J. Edell; Edward F. Gleason; Karen K. Gleason
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Article
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1998
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John Wiley and Sons
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English
β 296 KB
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Films deposited using pulsed plasma-enhanced chemical vapor deposition (PECVD) from hexafluoropropylene oxide (HFPO) were investigated by X-ray photoelectron spectroscopy (XPS). As compared to continuous rf PECVD, pulsed excitation increases the CF 2 fraction in the film. Film composition was determ