Layer-thickness dependence in tunneling
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Maya Watanabe; Hiroshi Toyao; Jun Okabayashi; Takeshi Yamaguchi; Junji Yoshino
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Article
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2007
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Elsevier Science
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English
โ 330 KB
We have investigated the layer-thickness dependence on tunneling magnetoresistance (TMR) in double-barrier structures using GaMnAs-based magnetic tunneling junctions in order to clarify the origin of low threshold current density for current-driven magnetization orientation reversal. The TMR charact