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Pull-In Voltage Study of Electrostatically Actuated Fixed-Fixed Beams Using a VLSI On-Chip Interconnect Capacitance Model

✍ Scribed by Chowdhury, S.; Ahmadi, M.; Miller, W.C.


Book ID
120305445
Publisher
IEEE
Year
2006
Tongue
English
Weight
692 KB
Volume
15
Category
Article
ISSN
1057-7157

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