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Pseudorandom self-testing of microprocessors

✍ Scribed by Plamen Georgiev Belomorski

Book ID
107910142
Publisher
Elsevier Science
Year
1987
Weight
802 KB
Volume
19
Category
Article
ISSN
0165-6074

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## Abstract The self‐test of built‐in RAMs is an excellent method to simplify the testing of VLSI. This paper considers the built‐in self‐test using the linear feedback shift registers on the pseudorandom input generator and the output signature analyzer. It is demonstrated that the method is usefu