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Pseudo depth profiling by ESCA and X-ray microanalysis: An application to chemical dealumination of Y-zeolites

✍ Scribed by J.N. Ness; D.J. Joyner; A.P. Chapple


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
277 KB
Volume
9
Category
Article
ISSN
0144-2449

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