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Proximal probe characterization of nanoscale charge transport properties in Co/SiO2multilayer structures

✍ Scribed by D. M. Schaadt; E. T. Yu; S. Sankar; A. E. Berkowitz

Book ID: 107452480
Publisher: Springer US
Year: 2000
Tongue: English
Weight: 192 KB
Volume: 29
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-000-0128-y

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