Proton-irradiated silicon: Complete electrical characterization of the induced dominant deep defects after long-term annealing

✍ Scribed by Marcel W. Hüppi

• Book ID: 103952583
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 289 KB
• Volume: 2
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/0921-5107(89)90081-0