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Proton-induced X-ray emission (PIXE) characterization of special glasses and multi-coated lenses

✍ Scribed by Y. H. Han; T. A. Cahill; S. J. Kim; J. F. Shackelford; C. Castaneda


Book ID
105696343
Publisher
TechnoPress
Year
2001
Tongue
English
Weight
544 KB
Volume
7
Category
Article
ISSN
1598-9623

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Chromia/alutuina catalysts with different metal loading were characterized using X-ray photoelectron spectroscopy (XPS), proton induced X-ray emission (PIXE) and thetmogravimetric (TG) techniques to elucidate the surface structure of these catalysts. XPS studies on calcined samples show a sharp incr