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Proton induced X-ray emission (PIXE) analysis on thick samples exemplified on the rare earth elements

✍ Scribed by R. P. H. Garten; K. O. Groeneveld; K. -H. König


Book ID
112364097
Publisher
Springer
Year
1981
Tongue
English
Weight
809 KB
Volume
307
Category
Article
ISSN
1618-2650

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A comparison between use of proton-induced x-ray emission (PIXE) and total reÑection x-ray Ñuorescence (TXRF) techniques in relation to the elemental analysis of amniotic Ñuid (AF) was carried out by measuring the concentrations of Cl, K, Ca, Fe, Cu, Zn and Br. For 10 AF samples analyzed, the agreem