✦ LIBER ✦
Proton induced single event upset cross section prediction for 0.15 μm six-transistor (6T) silicon-on-insulator static random access memories
✍ Scribed by Li, Lei; Zhou, Wanting; Liu, Huihua
- Book ID
- 127080064
- Publisher
- Japan Science and Technology Information Aggregator, Electronic
- Year
- 2012
- Tongue
- English
- Weight
- 604 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0022-3131
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