Proton Implantation Induced Damage to Heavily Doped n-GaAs as Envisaged by Charge Deep-Level Transient Spectroscopy

✍ Scribed by Thurzo, I. ;Pincík, E. ;Cicmanec, P.

• Book ID: 101376436
• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 262 KB
• Volume: 162
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(199708)162:2<547::aid-pssa547>3.0.co;2-a