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Proton-based total-dose irradiation effects on Cu/HfO 2 :Cu/Pt ReRAM devices

✍ Scribed by Butcher, Brian; He, Xiaoli; Huang, Mengbing; Wang, Yan; Liu, Qi; Lv, Hangbing; Liu, Ming; Wang, Wei


Book ID
121443997
Publisher
Institute of Physics
Year
2010
Tongue
English
Weight
769 KB
Volume
21
Category
Article
ISSN
0957-4484

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