Protection issues during system restoration

✍ Scribed by Sidhu, T.S.; Tziouvaras, D.A.; Apostolov, A.P.; Castro, C.H.; Chano, S.R.; Horowitz, S.H.; Kennedy, W.O.; Sungsoo Kim, ; Martilla, R.J.; McLaren, P.G.; Michel, G.L.; Mustaphi, K.K.; Mysore, P.; Nagpal, M.; Nelson, B.; Plumptre, F.P.; Sachdev, M.S.; Thorp, J.S.; Uchiyama, J.T.

• Book ID: 121261304
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 555 KB
• Volume: 20
• Category: Article
• ISSN: 0885-8977
• DOI: 10.1109/TPWRD.2004.839734