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Property-based test generation for scan designs and the effects of the test application scheme and scan selection on the number of detectable faults

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 119778901
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 362 KB
Volume: 21
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.998633

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