Properties of Y2O2S:Tb X-Ray Intensifying Screens
โ Scribed by Alves, R. V.; Buchanan, R. A.
- Book ID
- 117929082
- Publisher
- IEEE
- Year
- 1973
- Tongue
- English
- Weight
- 869 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0018-9499
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๐ SIMILAR VOLUMES
HERETOFORE, the sensitometric determinations of X-ray intensifying screen factors have not given reliable results owing to the fact that the intensity of the fluorescent light depends considerably on the quality and intensity of the incident X-rays, and the proper conditions for exposure of the scre
X-ray imaging detectors in combination with scintillator screens have been widely used in digital X-ray imaging applications. Gd 2 O 2 S:Tb was used as scintillation material for pixelated scintillator screens based on silicon substrates (wafer) with a micropore array of various dimensions fabricate