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Properties of the fluorine-implanted Si-SiO2 system : G. S. Virdi, C. M. S. Rauthan, B. C. Pathak and W. S. Khokle. Solid-St. Electron.34(8), 889 (1991)


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
110 KB
Volume
32
Category
Article
ISSN
0026-2714

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