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Properties of amorphous tin-doped indium oxide thin films deposited by O2/Ar mixture ion beam-assisted system at room temperature

✍ Scribed by H.J. Kim; J.W. Bae; J.S. Kim; K.S. Kim; Y.C. Jang; G.Y. Yeom; N.-E. Lee


Book ID
108422775
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
252 KB
Volume
131
Category
Article
ISSN
0257-8972

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