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Properties and applications of electron cyclotron plasma deposited SiOxNy films with graded refractive index profiles

✍ Scribed by Pavel V. Bulkin; Pieter L. Swart; Beatrys M. Lacquet


Book ID
115990402
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
303 KB
Volume
187
Category
Article
ISSN
0022-3093

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