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Projects of the Siberian Scientific-Research Institute of Metrology (SNIIM) in the measurement of microwave circuit characteristics

✍ Scribed by V. P. Petrov; É. M. Gutina; Yu. V. Kondakov; A. I. Kalmykov; V. P. Konoplev; K. K. Kostyuchenko; Yu. V. Ryasnyi


Book ID
112480646
Publisher
Springer US
Year
1974
Tongue
English
Weight
505 KB
Volume
17
Category
Article
ISSN
0543-1972

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