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Progress in the measurement of lattice spacing d(220) of silicon

✍ Scribed by Nakayama, K.; Fujimoto, H.

Book ID: 114543672
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 92 KB
Volume: 46
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.571922

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