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Production aspects of complex multilayer dielectric optical coatings

✍ Scribed by R Overend; DR Gibson

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
447 KB
Volume
43
Category
Article
ISSN
0042-207X

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The 'DataFurnace' code, based on the simulated annealing algorithm, was used to extract elemental depth profiles from Rutherford backscattering spectra of 4-layer and 21-layer anti-reflection coatings and a 22layer narrow-bandpass filter (respectively 240, 1140 and 800 nm thick). The layers are on a