Product Maturity 1: Theoretical Principles and Industrial Applications

✍ Scribed by Franck Bayle

• Publisher: Wiley-ISTE
• Year: 2022
• Tongue: English
• Leaves: 219
• Edition: 1
• Category: Library

✦ Synopsis

Every parent is concerned when a child is slow to become a mature adult. This is also true for any product designer, regardless of their industry sector. For a product to be mature, it must have an expected level of reliability from the moment it is put into service, and must maintain this level throughout its industrial use.

While there have been theoretical and practical advances in reliability from the 1960s to the end of the 1990s, to take into account the effect of maintenance, the maturity of a product is often only partially addressed.

Product Maturity 1 fills this gap as much as possible; a difficult exercise given that maturity is a transverse activity in the engineering sciences; it must be present throughout the lifecycle of a product.

✦ Table of Contents

Cover
Half-Title Page
Title Page
Copyright Page
Contents
Foreword by Laurent Denis
Foreword by Serge Zaninotti
Acknowledgements
Introduction
1. Reliability Review
1.1. Failure rate
1.2. Temperature effect
1.3. Effect of maintenance
1.4. MTBF
1.5. Nature of the reliability objective
2. Maturity
2.1. Context
2.2. Normative context and its implications
2.2.1. Quality standards
2.2.2. Quality management system and product quality
2.2.3. Product quality and dependability
2.2.4. Product dependability and maturity
2.2.5. Standards in various domains
2.2.6. Perspectives
2.3. Building of maturity
2.4. Confirmation of maturity
3. Derating Analysis
3.1. Derating
3.2. Rules provided by the manufacturers of components
3.2.1. CMS resistors
3.2.2. Capacitors
3.2.3. Magnetic circuits
3.2.4. Fuses
3.2.5. Resonators
3.2.6. Oscillators
3.2.7. Photocouplers
3.2.8. Diodes
3.2.9. Zener diodes
3.2.10. Tranzorb diodes
3.2.11. Low power bipolar transistors
3.2.12. Power bipolar transistors
3.2.13. Low power MOSFET transistors
3.2.14. High power MOSFET transistors
3.2.15. Integrated circuits
3.3. Reference-based approach
3.4. Creation of derating rules
3.4.1. Rules for constant temperature
3.4.2. Rule for voltage
3.5. Summary
4. Components with Limited Service Life
4.1. RDF 2000 guide
4.1.1. Power transistor
4.1.2. Photocouplers
4.1.3. Switch or push button
4.1.4. Connectors
4.2. FIDES 2009 guide
4.2.1. Fans
4.2.2. Batteries
4.3. Manufacturer’s data
4.3.1. Wet electrolytic capacitor
4.3.2. Connectors
4.3.3. Relays
4.3.4. Optocouplers
4.3.5. Batteries
4.3.6. Fans
4.3.7. Flash memories
4.3.8. Potentiometers
4.3.9. Quartz oscillators
4.3.10. Voltage references
4.4. Summary of components with limited service life
5. Analysis of Product Performances
5.1. Analyses during the design stage
5.1.1. Worst-case analysis
5.1.2. Quadratic analysis
5.1.3. Monte-Carlo analysis
5.1.4. Numerical simulations
5.2. Analyses during the manufacturing stage
6. Aggravated Tests
6.1. Definition
6.2. Objectives of aggravated tests
6.3. Principles of aggravated tests
6.3.1. Choice of physical constraints
6.3.2. Principle of HALT
6.3.3. Specific or additional constraints
6.3.4. Number of required samples
6.3.5. Operational test, diagnosis and identification of weaknesses
6.3.6. Monitoring specification
6.3.7. Instrumentation
6.3.8. Root cause analysis, corrective actions and breakdown management
6.4. Robustness
6.4.1. Estimation of robustness margins
6.4.2. Sufficient margins
7. Burn-In Test
7.1. Link between HALT and HASS tests
7.2. POS1 test
7.2.1. Miner’s approach
7.2.2. Approach according to the physical laws of failure
7.2.3. Zero-failure reliability proof approach
7.3. POS2 test
7.3.1. Influence of parameter Q
7.3.2. Influence of parameter p
7.3.3. Summary of the POS2 test
7.4. HASS cycle
7.4.1. Precipitation stage
7.4.2. Detection stage
7.5. Should burn-in tests be systematically conducted?
7.5.1. Constraints extrinsic to the equipment manufacturer
7.5.2. Constraints intrinsic to the equipment manufacturer
7.5.3. Decision criteria
7.6. Test coverage
7.7. Economic aspect of burn-in
7.7.1. No burn-in test is conducted
7.7.2. Burn-in test is conducted
8. Run-In
8.1. Run-in principle
8.2. Stabilization
8.2.1. Proposed principle
8.2.2. Drift acceleration law
8.2.3. Choice of the drift model
8.2.4. Equivalent level of physical contribution
8.3. Expression of the corresponding degradation
8.4. Optimization of the stabilization time
8.5. Estimation of a prediction interval of the degradation
8.5.1. Principle of the stabilization method
List of Notations
List of Definitions
A
B
C
D
E
F
L
M
N
O
P
Q
R
S
T
List of Acronyms
References
Index
Other titles from iSTE in Mechanical Engineering and Solid Mechanics
EULA