✦ LIBER ✦
Processing factors influencing the leakage current in shallow junction diodes for deep submicro-meter CMOS
✍ Scribed by L. Grau; E. Augendre; E. Simoen; R. Rooyackers; C. Claeys; G. Badenes; A. Romano-Rodriguez
- Book ID
- 110299509
- Publisher
- Springer US
- Year
- 2001
- Tongue
- English
- Weight
- 521 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0957-4522
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