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Process Tomography of Ion Trap Quantum Gates

✍ Scribed by Riebe, M.; Kim, K.; Schindler, P.; Monz, T.; Schmidt, P. O.; Körber, T. K.; Hänsel, W.; Häffner, H.; Roos, C. F.; Blatt, R.

Book ID: 121505204
Publisher: The American Physical Society
Year: 2006
Tongue: English
Weight: 370 KB
Volume: 97
Category: Article
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.97.220407

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