Process-related risk of beryllium sensitization and disease in a copper–beryllium alloy facility

✍ Scribed by Christine R. Schuler; Michael S. Kent; David C. Deubner; Michael T. Berakis; Michael McCawley; Paul K. Henneberger; Milton D. Rossman; Kathleen Kreiss

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 152 KB
• Volume: 47
• Category: Article
• ISSN: 0271-3586
• DOI: 10.1002/ajim.20140