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Process optimization of polymetal (W/WN/Polysilicon) gate and its impact on dynamic random-access memory chip performance in 0.14-µm technology

✍ Scribed by Pil Bo Shim; Jun-Ho Choy; Gyung Sun Gil; Ki Myung Kyung; Ju Cheol Park


Book ID
107452731
Publisher
Springer US
Year
2002
Tongue
English
Weight
891 KB
Volume
31
Category
Article
ISSN
0361-5235

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