Problems of the metrologic provision of the technique for measuring the structure of solids using atomic force microscopy with nanometer resolution

✍ Scribed by S. S. Gotz, R. Z. Bakhtizin, G. I. Zhuravlev, S. A. Sevnitsky

• Book ID: 120956578
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2013
• Tongue: English
• Weight: 141 KB
• Volume: 8
• Category: Article
• ISSN: 1995-0780
• DOI: 10.1134/S1995078013030105