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Problems in automating metrological tests and in certifying and checking microprocessor data-acquisition systems

✍ Scribed by V. E. Bezvenyuk; G. E. Bogoslavskii; Z. K. Vlasenko; Yu. V. Golubev; V. S. Zelenevskii; V. R. Safonov

No coin nor oath required. For personal study only.

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