Probing the new IEEE Reliability Test System (RTS-96): HL-II assessment

✍ Scribed by Pinheiro, J.M.S.; Dornellas, C.R.R.; Schilling, M.Th.; Melo, A.C.G.; Mello, J.C.O.

• Book ID: 115526260
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 634 KB
• Volume: 13
• Category: Article
• ISSN: 0885-8950
• DOI: 10.1109/59.651632