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Probing into the effect of Auger recombination mechanism on zero bias resistance–area product in In1−xGaxAs detector

✍ Scribed by Yuchun Chang; Bao Shi; Longhai Li; Jingzhi Yin; Fubin Gao; Guotong Du; Yixin Jin


Book ID
113915571
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
345 KB
Volume
151
Category
Article
ISSN
0038-1098

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