Probing complex magnetic structures in thin films: Resonant magnetic soft x‐ray scattering at the lanthanide M 5 edges

✍ Scribed by Weschke, E.; Ott, H.; Schukler‐Langeheine, C.; Grigoriev, A. Yu.; Meier, R.; Kaindl, G.

• Book ID: 127181475
• Publisher: Informa UK (Taylor & Francis)
• Year: 2004
• Tongue: English
• Weight: 734 KB
• Volume: 17
• Category: Article
• ISSN: 0894-0886
• DOI: 10.1080/08940880408603119