Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation

✍ Scribed by Wiemann, C.; Patt, M.; Cramm, S.; Escher, M.; Merkel, M.; Gloskovskii, A.; Thiess, S.; Drube, W.; Schneider, C. M.

• Book ID: 115449189
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 846 KB
• Volume: 100
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.4722940