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Probe characterization in ac field measurements of surface crack depth

✍ Scribed by D. Mirshekar-Syahkal

Book ID: 112373408
Publisher: Springer-Verlag
Year: 1982
Tongue: English
Weight: 561 KB
Volume: 3
Category: Article
ISSN: 0195-9298
DOI: 10.1007/bf00566950

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