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Probe-bar and multiprobe methods of measuring Hall mobility for nonuniform-in-depth semiconductor layers

✍ Scribed by N. I. Pavlov; V. L. Kon'kov; V. I. Golubev


Book ID
112426119
Publisher
Springer
Year
1972
Tongue
English
Weight
378 KB
Volume
15
Category
Article
ISSN
1573-9228

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