๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Probability of Double Ionization by Electron Impact for Neon, Argon, and Xenon

โœ Scribed by Morrison, J. D.; Nicholson, A. J. C.


Book ID
118068929
Publisher
American Institute of Physics
Year
1959
Tongue
English
Weight
430 KB
Volume
31
Category
Article
ISSN
0021-9606

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Information about TS-1 and TS-2 double i
โœ R.D. DuBois; J. Gavin; O.G. de Lucio ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 177 KB

Ejected electron angular distributions are measured for single and double ionization of argon by 500 eV positron and electron impact. Double to single ionization ratios show marked differences as a function of projectile charge. Combinations of the positron and electron data and a simple double ioni