Probabilistic Short-Circuit Uprating of Station Strain Bus System??? Reliability and Operating Considerations

✍ Scribed by Ramani, N.; Wang, L.; Tanaka, W. H.; Macedo, F. X.

• Book ID: 119809966
• Publisher: IEEE
• Year: 1986
• Tongue: English
• Weight: 217 KB
• Volume: PER-6
• Category: Article
• ISSN: 0272-1724
• DOI: 10.1109/mper.1986.5527605